CIQTEK to Showcase High-Speed Volume EM at 2026 vEM Technology Forum
CIQTEK to Showcase High-Speed Volume EM at 2026 vEM Technology Forum
September 28, 2026
CIQTEK will join the 2026 vEM Technology Forum at Peking University in Beijing, showcasing our latest Volume Electron Microscopy (Volume EM) solutions.
Visitors can meet the CIQTEK team at our booth to explore how high-speed SEM, low-kV high-resolution imaging, automated large-area acquisition, and 3D reconstruction can help researchers handle increasingly large and complex volume microscopy datasets.
CIQTEK Poster Presentation
At the forum, Xin Ren (Luke), CIQTEK Senior Electron Microscopy Solution Manager, will present our latest work on high-speed SEM for large-scale Volume EM.
Poster Title: Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK
The poster will explore how the HEM6000 combines high imaging speed, strong low-kV resolution, large-area imaging, and intelligent automation to support large-scale Volume EM workflows.
Meet CIQTEK in Beijing
The 2026 vEM Technology Forum brings together researchers and microscopy experts to exchange ideas around Volume EM technologies, workflows, automation, large-scale imaging, data processing, and emerging applications.
We look forward to meeting the vEM community, sharing our latest developments, and hearing about the real imaging challenges researchers are working on.
Visit the CIQTEK booth, meet our EM team, and discover what high-speed Volume EM can bring to your research.
Date: October 11–15, 2026 Location: Peking University, Beijing, China
고속 완전 자동화된 필드 방출 주사전자현미경 워크스테이션 CIQTEK HEM6000 고휘도 대구경 전류 전자총, 고속 전자빔 편향 시스템, 고전압 샘플 스테이지 감속, 동적 광학 축, 침지 전자기 및 정전기 콤보 대물 렌즈와 같은 시설 기술을 사용하여 나노 스케일 분해능을 보장하는 동시에 고속 이미지 획득을 달성합니다. 자동화된 작업 프로세스는 더욱 효율적이고 스마트한 대면적 고해상도 이미징 워크플로우와 같은 응용 분야를 위해 설계되었습니다. 이미징 속도는 기존 전계방출 주사전자현미경(FESEM)보다 5배 이상 빠릅니다.